Exhibition

High-Power Device Testing System

Technology Introduction:
A single-die testing system using the B1505A evaluated probe landing position, repeated contacts, scratch length, and triboelectric charging, improving measurement accuracy and efficiency. Devices underwent short-circuit tests, with LTSPICE and TCAD simulations analyzing temperature-induced failure mechanisms, followed by optical and SEM failure analysis.
Industry Applicability:
The High-Power Device Testing System maps electrical characteristics across a bare die to determine the optimal probe position. LTSPICE models predict short-circuit I-V behavior and internal temperatures to identify device limits. Industrial adoption can improve bare-die testing accuracy and efficiency and anticipate packaged device performance, preventing damage.

Industrial Applications:
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National Taiwan University

At present, the University consists of 16 colleges, 58 departments, 146 graduate institutes, as well as 34 Master's and PhD degree programs. NTU's programs cover a wide array of disciplines across science, arts, and the humanities, with up to 8,000 courses made available for selection each semester.

Contact Information

Name:-
Tel:02-3366-5733
Address:No. 1, Sec. 4, Roosevelt Rd., Taipei 10617, Taiwan (R.O.C.)
Email

Additional Information

Pavilion:Future Tech AI Applications and Industry-Academia Co-op FJ11
Exhibiting Entity:National Science and Technology Council
Application Category:Information and Communications
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