2022In-line Semiconductor N2 Process Critical Dimension X-ray metrology Tool (XRCD)
In-line Semiconductor N2 Process Critical Dimension X-ray metrology Tool (XRCD)
2022iSure愛關懷Smart_Care iSure Smart Care
2021 PICTURE DELIVERING SYSTEM BASED ON VISUAL CRYPTOGRAPHY AND RELATED COMPUTER PROGRAM PRODUCT / JRSYS International Corporation
2021 Nonwoven fabrics of ultrafine long fibers / Taiwan Textile Research Institute
2021 Chip scale of FMCW LiDAR and photoelectric drive control module / Industrial Technology Research Institute
Coming soon!