A image analysis system applied to the detection of the number of graphene layers and method of use thereof
Raman can change the intensity of a G-band and change the Raman frequency of a 2D-band.The transmission spectrum is obtained by measuring the transmittance of the layer information.The single-layer graphene has a penetration of 97.7%.Atomic force microscopy can determine the roughness of the surface. In contrast, optical microscopy provides fast imaging speeds that can be used as a quick and intuitive way to visualize the graphite layer and obtain relevant information about multilayer graphene. This creation uses multi-spectral color image reproduction technology and is matched with microscopes, CCDs, and other devices.It can be applied to the rapid detection and identification of low-layer graphene on transparent substrates or other industries (such as yield and quality).
Induction type power supply system and intruding metal detection method thereof
Induction type power supply system and intruding metal detection method thereof
Inductive power supply system and intruding metal detection method thereof
Nanofluid/ultrasonic atomization micro-lubrication system development and application intelligent modeling method to improve the multiple quality characteristics of the micro-machining process research and optimal prediction model establishment
Technology maturity:Trial production
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