首頁 展示資訊 展品查詢

OPTICAL BEAM NFP (NEAR FIELD PATTERN) MEASUREMENT SYSTEM

回上一頁

OPTICAL BEAM NFP (NEAR FIELD PATTERN) MEASUREMENT SYSTEM

Optical beam NFP (Near Field Pattern) measurement system is general- purpose beam profiler system, widely applicable from optical beam observation to highly advanced optical beam analysis. Synos’ M-Scope type S, sophisticated NFP measurement optics, is adopted as NFP measurement optics in this system. By selecting imaging detector, it will be applicable for optical beam profile observation and analysis from visible to 1.55um spectral range, corresponding to measurement wavelength and purpose. Furthermore, EF(Encircled Flux) measurement that is regulated as IEC61280-1-4 as regulation of new launch condition for GI MMF, is supported.

Synergy Optosystems Co., Ltd.

SYNERGY OPTOSYSTEMS CO., LTD. (head office : Hamamatsu-shi, Shizuoka, JAPAN) independently develops various optical instruments and related products targeting on optical measurement and analysis. We have a wide lineup of products such as specially designed optics, imaging detectors, optical measurement instruments, light sources that can be applied to optical application measurement in various fields centered on optical communication, optical interconnection, optical devices, optoelectronics, automotive photonics. We have rich lineups of various optical measurement and analysis solutions such as high-performance laser beam profiler, various optical beam measurement and analysis systems, special-purpose optical measurement systems, and custom-made systems.

聯絡人

  • 姓名:Manabu Yasukawa

  • 電話:+81-53-523-8453

  • 地址:Synergy Optosystems Co., Ltd.

Email

其他資訊

  • 展館別:未來科技館

  • 所屬代表參展單位:經濟部產業技術司

  • 主要應用領域:電子與光電

位置 更多資訊

相關網站連結

  • 技術成熟度:量產上市

  • 展示目的:商機推廣

  • 流通方式:自行洽談

詢問

*服務單位

*姓名

*Email

*洽商內容/需求

需求說明

洽商單

*服務單位

*姓名

*Email

*電話

*您參觀這項展品的主要目的?

*您是否希望進一步洽談




*您的職務類別







*展覽整體評價

*最喜歡的展區

*期待展覽著重的技術領域

*是否願意收到電子報/最新資訊


其他建議

敬請期待!

TOP

會員登入

帳號

密碼

忘記密碼