OPTICAL METHOD MICRO STRUCTURAL WAVEGUIDE INSERTION LOSS MEASUREMENT SYSTEM
This is the optical method insertion loss measurement system targeting on micro structural waveguide device using Synos’ original optical beam irradiation and detection measurement optics M-Scope type J/PF. It is possible to execute high speed and efficient insertion loss measurement of micro structural waveguide device such as silicon photonics waveguide device, near-field optical device and so on.
SYNERGY OPTOSYSTEMS CO., LTD. (head office : Hamamatsu-shi, Shizuoka, JAPAN) independently develops various optical instruments and related products targeting on optical measurement and analysis. We have a wide lineup of products such as specially designed optics, imaging detectors, optical measurement instruments, light sources that can be applied to optical application measurement in various fields centered on optical communication, optical interconnection, optical devices, optoelectronics, automotive photonics. We have rich lineups of various optical measurement and analysis solutions such as high-performance laser beam profiler, various optical beam measurement and analysis systems, special-purpose optical measurement systems, and custom-made systems.
FFP (FAR FIELD PATTERN) MEASUREMENT SYSTEM
OPTICAL BEAM NFP (NEAR FIELD PATTERN) MEASUREMENT SYSTEM
ORGANIC ELECTROLUMINESCENT MATERIAL CONTAINING ALKALINE EARTH METAL BASED METAL-ORGANIC FRAMEWORKS AND ORGANIC ELECTROLUMINESCENT DEVICE USING THE SAME
ELECTROMAGNETIC BAND GAP STRUCTURE FOR MULTIPLE FREQUENCY BANDS
Technology maturity：Mass production
Exhibiting purpose：Product promotion
Trading preferences：Negotiate by self
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