Optical beam NFP (Near Field Pattern) measurement system is general- purpose beam profiler system, widely applicable from optical beam observation to highly advanced optical beam analysis. Synos’ M-Scope type S, sophisticated NFP measurement optics, is adopted as NFP measurement optics in this system. By selecting imaging detector, it will be applicable for optical beam profile observation and analysis from visible to 1.55um spectral range, corresponding to measurement wavelength and purpose. Furthermore, EF(Encircled Flux) measurement that is regulated as IEC61280-1-4 as regulation of new launch condition for GI MMF, is supported.
SYNERGY OPTOSYSTEMS CO., LTD. (head office : Hamamatsu-shi, Shizuoka, JAPAN) independently develops various optical instruments and related products targeting on optical measurement and analysis. We have a wide lineup of products such as specially designed optics, imaging detectors, optical measurement instruments, light sources that can be applied to optical application measurement in various fields centered on optical communication, optical interconnection, optical devices, optoelectronics, automotive photonics. We have rich lineups of various optical measurement and analysis solutions such as high-performance laser beam profiler, various optical beam measurement and analysis systems, special-purpose optical measurement systems, and custom-made systems.
OPTICAL METHOD MICRO STRUCTURAL WAVEGUIDE INSERTION LOSS MEASUREMENT SYSTEM
FFP (FAR FIELD PATTERN) MEASUREMENT SYSTEM
ORGANIC ELECTROLUMINESCENT MATERIAL CONTAINING ALKALINE EARTH METAL BASED METAL-ORGANIC FRAMEWORKS AND ORGANIC ELECTROLUMINESCENT DEVICE USING THE SAME
TEMPERATURE MEASUREMENT CORRECTION METHOD, ELECTRONIC SYSTEM AND METHOD OF GENERATING CORRECTION REGRESSION COEFFICIENT TABLE
Technology maturity：Mass production
Exhibiting purpose：Product promotion
Trading preferences：Negotiate by self
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