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FFP (FAR FIELD PATTERN) MEASUREMENT SYSTEM

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FFP (FAR FIELD PATTERN) MEASUREMENT SYSTEM

This is the FFP analysis system by dedicated FFP measurement optics and image processing method, widely applicable to FFP analysis of various optical devices such as laser diode, optical fiber, OPCB waveguide, etc. Synos’ M-Scope type F, FFP measurement optics, is adopted as measurement optics in this system. By selecting imaging detector, it will be applicable for optical beam profile observation and analysis from visible to 1.55um spectral range, corresponding to measurement wavelength and purpose. Furthermore, EAF(Encircled Angular Flux) measurement that is regulated as IEC61300-3053 as regulation of new launch condition for SI MMF.

Synergy Optosystems Co., Ltd.

SYNERGY OPTOSYSTEMS CO., LTD. (head office : Hamamatsu-shi, Shizuoka, JAPAN) independently develops various optical instruments and related products targeting on optical measurement and analysis. We have a wide lineup of products such as specially designed optics, imaging detectors, optical measurement instruments, light sources that can be applied to optical application measurement in various fields centered on optical communication, optical interconnection, optical devices, optoelectronics, automotive photonics. We have rich lineups of various optical measurement and analysis solutions such as high-performance laser beam profiler, various optical beam measurement and analysis systems, special-purpose optical measurement systems, and custom-made systems.

Contact

  • Name:Manabu Yasukawa

  • Phone:+81-53-523-8453

  • Address:Synergy Optosystems Co., Ltd.

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Other Information

  • Pavilion:Future Tech

  • Affiliated Ministry:Department of Industrial Technology,MOEA

  • Application Field:Electronics & Optoelectronics

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  • Technology maturity:Mass production

  • Exhibiting purpose:Product promotion

  • Trading preferences:Negotiate by self

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