Introduce a new type of near-field measurement system with a high-precision robot arm environment. The near-field radiated electromagnetic field changes with frequency and time to successfully measure and verify the cause and location of problems in operation of multi-port circuits, and establish a new model for system characteristics test and verification Measurement technology. The technical content is the development of non-contact near-field technology "system circuit level static dissipation path detection", "system circuit synchronous switching noise frequency domain and time domain measurement and application"1. Double-sided point needle direct calibration measurement technology: There is no direct double-sided point needle contact measurement technology in the world at present. The technical difficulty lies in the double-sided calibration jig with broadband and impedance matching, stable point needle and trial system The pin holder system of the microcircuit has been completed by Fangzhan and has patent protection.
2. Development and application of near-field measurement technology in the verification of system circuit characteristics: integration of a double-sided pin-point contact system in the near-field system, introduction of time/frequency domain signal source and receiving display systemResearch and development has brought vast benefits to future development and industrial applications:
1. Results and benefits spread to the entire supply chain of the semiconductor industry. There is a substantial industrial-academic cooperation relationship, and the use of developed technologies to help solve problems.
2. To assist in the research and development of laws and regulations of government units and the development and planning of key technologies of financial corporations.
3. Deepen technical cooperation, become a key partner in research and development, assist in establishing measurement technology and analytical energy, and continue to inject equipment funds to continue technical development.