We provide solutions for electric noise for nanoelectronic devices such as MOSFETs.
(Product 1) Entrope®️ High-Frequency Noise Probe: for a broadband on-wafer noise measurement
(Product 2) Cryogenic Entrope®️: Variable temperature broadband noise measurement system from room temperature down to 4 Kelvin
Enhancing Anodization of Semiconductor Materials Technology with Waf er Bonding Transforming Interface Function
Low-Temperature Defects Elimination Technology for Semiconductor devices
The realization of two-dimensional semiconductor device with atomic thickness
High-quality graphene wafers as multifunctional epitaxal substrate in the next generation of semiconductors
Technology maturity：Trial production
Exhibiting purpose：Technology transactions、Product promotion
Trading preferences：Negotiate by self
Coming soon!