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High mobility materials, process, stacked channels, and thermal circuit simulation; Ferroelectric X:HfO2 for Negative Capacitance and POC(Proof-of-Concept) Applications; Atomic layer technologies for

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High mobility materials, process, stacked channels, and thermal circuit simulation; Ferroelectric X:HfO2 for Negative Capacitance and POC(Proof-of-Concept) Applications; Atomic layer technologies for

1.High mobility Ge channel stacked gate-all-around transistors
2.Fabrication of 3-D NCFETs, corresponding module development, ferroelectric tunneling memristor for neuromorphic computing, and the co-simulation between embedded memory and devices
3. Circuit level thermal-electrical SPICE modeling, providing the junction temperature and the temperature distribution in the metal lines for reliability prediction.

Contact

  • Name:Chee Wee Liu

  • Phone:02-33663700分機515

  • Address:

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  • Pavilion:Future Tech Semiconductor block

  • Affiliated Ministry:National Science and Technology Council

  • Application Field:Electronics & Optoelectronics

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  • Technology maturity:Experiment stage

  • Exhibiting purpose:Display of scientific results

  • Trading preferences:Technical license/cooperation

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